Avoiding Common Time Traps in ICP-MS Analysis: A Virtual Workshop

Inductively coupled plasma–mass spectrometry (ICP-MS) is a fast, multielement technique used for trace elemental analysis.

But labs that use ICP-MS – or are thinking of installing one – can find it difficult to unlock the true potential of the technique. Unproductive and often unnecessary activities can eat into lab time, reducing productivity, increasing stress, and potentially impacting data quality. Open to all; this workshop will provide insights you can employ to improve efficiency in your laboratory while also reducing pressure on staff and increasing confidence in the results you report.



Bert Woods
Application Scientist
Agilent Technologies, Inc.

Joined the Agilent ICP-MS team in 2004, with previous employment in the semiconductor industry with Dominion Semiconductor (IBM/Toshiba) and Micron. Bert is a 1997 Chemistry graduate of Radford University in Virginia and an avid Washington DC Sports fan.


L. Craig Jones
ICP-MS Application Scientist
Agilent Technologies, Inc.

Craig has been with Agilent for over 15 years as an ICP-MS applications scientist. He has been involved with multiple types of applications for ICP-MS, including environmental, pharmaceutical, nutraceutical, semiconductor, geologic, and clinical analyses, to name a few. Previous to Agilent, he worked in an environmental lab performing analysis and supervising both the inorganic and organic sections of the laboratory. In his spare time, Craig enjoys volunteering at the local marine science centre, mountain biking, hiking and relaxing at the beach. Craig obtained a bachelor of science degree in chemistry from Fort Lewis College in Durango, CO.


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